About Us

Borries Health Security and Biosecurity Strategy

With new virus threatening global human health, Borries’ mission is to mitigate new virus outbreak and build a brand-new virus diagnostic system based on innovative STEM and image processing technology. Borries’ founding team has strong electronic optical, image processing background and marketing experience.

Our Technology

Today’s AI in imaging technology is very well understood and developed, but to fully embrace AI for electron microscopy imaging, several hardware technological breakthroughs need to happen in electron optics system design. 

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Borries Patents

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/ Patents
Patent number: 11094499

Apparatus of Charged-Particle Beam Such as Electron Microscope Comprising Sliding Specimen Table Within Objective Lens.

The present invention provides an apparatus of charged-particle beam such as an electron microscope including a specimen table that can slide on a planar surface around the lower pole piece of the objective lens. The specimen table is confined in a specimen stage having one elastic protrusion and one or more elastic force receiving parts (e.g three permanent protrusions) that contact and press the table. When the specimen is under microscopic examination, disturbing vibration cannot generate a force sufficient to overcome the limiting friction between the specimen table and the planar surface of the objective lens. The invention exhibits numerous technical merits such as minimal or zero vibration noise, and improved image quality, among others.

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/ Patents
Patent number: 11295927

Apparatus of Charged-Particle Beam Such as Electron Microscope Comprising Co-Condensers for Continuous Image Resolution Tuning.

The present invention provides an apparatus of charged-particle beam such as an electron microscope with co-condensers. A source of charged particles is configured to emit a beam of charged particles, and the co-condensers including two or more magnetic condensers are configured to coherently focus the beam to a single crossover spot. The invention exhibits numerous technical merits such as continuous image resolution tuning, and automatic switching between multiple resolutions, among others.

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/ Patents
Patent number: 11257659

Electrode Assembly, Electronic Apparatus/Device Using the Same, and Apparatus of Charged-Particle Beam Such as Electron Microscope Using the Same.

The present invention provides an electrode assembly comprising two or more electrodes arranged around a primary axis forming a non-cylindrical channel space. General electronic apparatus/device, particularly apparatus of charged-particle beam such as electron microscope, may use the electrode assembly to create an optimized pattern of electrical field within non-cylindrical channel space. When the electrode assembly is used as a beam deflector in a magnetic objective lens, the electrical field within the central channel space can be co-optimized with the magnetic field for reducing aberration(s) such as distortion, field curvature, astigmatism, and chromatic aberration, after the beam passes through the central channel space.

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