Our internally developed automated STEM system directly tackles this issue by capturing images of the entire grid comprehensively.
This capability is becoming increasingly vital for applications including structural analysis, nanoparticle characterization, and materials defect detection, where the completeness and reproducibility of data significantly influence the reliability of your findings.
This method offers several important benefits:
Cost and turnaround efficiency
Increasingly demand large datasets for statistical significance
Eliminates sampling bias - Full grid automated imaging captures everything, giving a complete, unbiased dataset
Reproducibility and consistency - Automated systems apply the same imaging parameters (exposure, focus, magnification) consistently across the entire grid, reducing operator-to-operator variability.
Fast
Auto sample load/unload
Auto full grid scanning
ROI scanning
Intelligent
High resolution and high landing energy up to 45KeV
Large FOV
Patent sliding specimen stage integrated within the objective lens
